A Wafer Level Testability Approach Based on an Improved Scan Insertion Technique (Record no. 743924)

MARC details
000 -LEADER
fixed length control field 00606nab a2200169Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s1995 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Bolchini, C
9 (RLIN) 772988
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Buonanno, G.
9 (RLIN) 777381
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Buonanno, Giacomo
9 (RLIN) 777382
245 #2 - TITLE STATEMENT
Title A Wafer Level Testability Approach Based on an Improved Scan Insertion Technique
300 ## - PHYSICAL DESCRIPTION
Extent 438-447 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Wafer
9 (RLIN) 712604
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Approach
9 (RLIN) 716460
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Insertion for ce
9 (RLIN) 777385
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 1995
Title IEEE Transactions on Components, Packaging, and Manufacturing Technology Part-B: Advanced Packaging
International Standard Serial Number 10709894
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
-- 51
-- ABUL KALAM Library
Holdings
Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
  Engr Abul Kalam Library Vol.18, No.03 (Aug. 1995)   19/08/2023 Articles