Test Vehicle for a Wafer-Scale Field Programmable Gate Array (Record no. 743920)

MARC details
000 -LEADER
fixed length control field 00553nab a2200157Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s1995 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Du for t, Benoit
9 (RLIN) 777371
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Chapman, G. H.
9 (RLIN) 774915
245 #0 - TITLE STATEMENT
Title Test Vehicle for a Wafer-Scale Field Programmable Gate Array
300 ## - PHYSICAL DESCRIPTION
Extent 431-437 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Test Algorithm
9 (RLIN) 777373
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Wafer
9 (RLIN) 712604
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Gate Drives
9 (RLIN) 777374
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 1995
Title IEEE Transactions on Components, Packaging, and Manufacturing Technology Part-B: Advanced Packaging
International Standard Serial Number 10709894
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
-- 51
-- ABUL KALAM Library
Holdings
Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
  Engr Abul Kalam Library Vol.18, No.03 (Aug. 1995)   19/08/2023 Articles