A Test Chip Design for Detecting Thin-Film Cracking in Integrated Circuits (Record no. 743795)

MARC details
000 -LEADER
fixed length control field 00556nab a2200157Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s1995 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Chen, Kua L.
9 (RLIN) 777017
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Zarudnij, Vladimir
9 (RLIN) 767221
245 #2 - TITLE STATEMENT
Title A Test Chip Design for Detecting Thin-Film Cracking in Integrated Circuits
300 ## - PHYSICAL DESCRIPTION
Extent 478-484 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Test
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Integrated
9 (RLIN) 161853
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Chenilie Yarn
9 (RLIN) 777019
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 1995
Title IEEE Transactions on Components, Packaging, and Manufacturing Technology Part-B: Advanced Packaging
International Standard Serial Number 10709894
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
-- 51
-- ABUL KALAM Library
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Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
  Engr Abul Kalam Library Vol.18, No.03 (Aug. 1995)   19/08/2023 Articles