A Critique OfReliability Analysis Center Failure-Rate-Model for Plastic Encapsulated Microcircuits (Record no. 743487)

MARC details
000 -LEADER
fixed length control field 00577nab a2200157Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s1998 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Shukla, Anand A.
9 (RLIN) 770029
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Pecht, Michael G.
9 (RLIN) 94102
245 #2 - TITLE STATEMENT
Title A Critique OfReliability Analysis Center Failure-Rate-Model for Plastic Encapsulated Microcircuits
300 ## - PHYSICAL DESCRIPTION
Extent 110-113 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Reliability Assessment
9 (RLIN) 695752
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Reliability Modeling
9 (RLIN) 762530
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Plastic Encapsulated Microcircuit (Pem)
9 (RLIN) 776248
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 1998
Title IEEE Transactions on Reliability
International Standard Serial Number 00189529
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
-- 51
-- ABUL KALAM Library
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Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
  Engr Abul Kalam Library Vol.47, No.02 (Jun. 1998)   19/08/2023 Articles