Test Vehicle for a Wafer-Scale Thermal Pixel Scens Simulator (Record no. 742890)

MARC details
000 -LEADER
fixed length control field 00508nab a2200145Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s1994 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Chapman, G. H.
9 (RLIN) 774915
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Carr, L. S.
9 (RLIN) 774916
245 #0 - TITLE STATEMENT
Title Test Vehicle for a Wafer-Scale Thermal Pixel Scens Simulator
300 ## - PHYSICAL DESCRIPTION
Extent 334-341 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Wafer
9 (RLIN) 712604
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Pixel Wise
9 (RLIN) 723487
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 1994
Title IEEE Transactions on Components, Packaging, and Manufacturing Technology Part-B: Advanced Packaging
International Standard Serial Number 10709894
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
-- 51
-- ABUL KALAM Library
Holdings
Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
  Engr Abul Kalam Library Vol.17, No.03 (Aug. 1994)   19/08/2023 Articles