Cosmic-Ray Soft Error Rate Characterization of a Standard 0.6-Um Cmos Process (Record no. 741525)

MARC details
000 -LEADER
fixed length control field 00553nab a2200157Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s2000 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Hazucha, Peter
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Svensson, Christer
9 (RLIN) 769727
245 #0 - TITLE STATEMENT
Title Cosmic-Ray Soft Error Rate Characterization of a Standard 0.6-Um Cmos Process
300 ## - PHYSICAL DESCRIPTION
Extent 1422-1429 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Circuit Reliability
9 (RLIN) 771511
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Integrated Circuit Design
9 (RLIN) 771513
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Manufacturing Process Characterization
9 (RLIN) 771515
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 2000
Title IEEE Journal of Solid-State Circuits
International Standard Serial Number 00189200
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
-- 51
-- ABUL KALAM Library
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  Engr Abul Kalam Library Vol.35, No.10 (Oct. 2000)   19/08/2023 Articles