Cosmic-Ray Soft Error Rate Characterization of a Standard 0.6-Um Cmos Process (Record no. 741525)
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000 -LEADER | |
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fixed length control field | 00553nab a2200157Ia 4500 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 230808s2000 |||||||f |||| 00| 0 eng d |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Hazucha, Peter |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Svensson, Christer |
9 (RLIN) | 769727 |
245 #0 - TITLE STATEMENT | |
Title | Cosmic-Ray Soft Error Rate Characterization of a Standard 0.6-Um Cmos Process |
300 ## - PHYSICAL DESCRIPTION | |
Extent | 1422-1429 p. |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Circuit Reliability |
9 (RLIN) | 771511 |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Integrated Circuit Design |
9 (RLIN) | 771513 |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Manufacturing Process Characterization |
9 (RLIN) | 771515 |
773 ## - HOST ITEM ENTRY | |
Place, publisher, and date of publication | 2000 |
Title | IEEE Journal of Solid-State Circuits |
International Standard Serial Number | 00189200 |
942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
Koha item type | Articles |
-- | 51 |
-- | ABUL KALAM Library |
Not for loan | Home library | Serial Enumeration / chronology | Total Checkouts | Date last seen | Koha item type |
---|---|---|---|---|---|
Engr Abul Kalam Library | Vol.35, No.10 (Oct. 2000) | 19/08/2023 | Articles |