Accelerated Degradation-Tests with Tightened Critical Values (Record no. 740268)

MARC details
000 -LEADER
fixed length control field 00515nab a2200157Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s2002 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Yang, Guangbin
9 (RLIN) 767510
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Yang, Kai
245 #0 - TITLE STATEMENT
Title Accelerated Degradation-Tests with Tightened Critical Values
300 ## - PHYSICAL DESCRIPTION
Extent 463-468 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Accelerated Degradation Test (Adt)
9 (RLIN) 730603
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Critical Value
9 (RLIN) 764408
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Performance Characteristics
9 (RLIN) 730883
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 2002
Title IEEE Transactions on Reliability
International Standard Serial Number 00189529
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
-- 51
-- ABUL KALAM Library
Holdings
Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
  Engr Abul Kalam Library Vol.51, No.04 (Dec. 2002)   19/08/2023 Articles