Soft Error Reliability of VLSI Circuits Analysis and Mitigation Techniques (Record no. 701212)

MARC details
000 -LEADER
fixed length control field 03713nam a22002657a 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230203s2021 |||||||| |||| 00| 0 eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9783030516093
022 ## - INTERNATIONAL STANDARD SERIAL NUMBER
ISSN-L 9783030516093
041 ## - LANGUAGE CODE
Language code of text/sound track or separate title English
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.3815
Item number GHA
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Ghavami, Behnam
9 (RLIN) 673658
Relator term author
245 ## - TITLE STATEMENT
Title Soft Error Reliability of VLSI Circuits Analysis and Mitigation Techniques
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. Cham, Switzerland :
Name of publisher, distributor, etc. Springer,
Date of publication, distribution, etc. c2021
300 ## - PHYSICAL DESCRIPTION
Extent XIII, 114 p.
Other physical details : ill
500 ## - GENERAL NOTE
General note Behnam Ghavami was born in Esfarayen, Iran. He received his Ph.D. degree in computer engineering from Amirkabir University of Technology, Tehran, Iran. He has been serving as a Faculty Member with the Computer Engineering Department, Shahid Bahonar University of Kerman, since 2010, where he is currently Tenured Associate Professor. He teaches courses in design of digital systems, computer architecture, FPGA design, and reliable circuit design. He has supervised or co-supervised about 20 graduate students. He has published over 100 refereed papers. His research interests include the design automation of digital systems, robust logic designs, and FPGA-based design. He is currently an Associate Editor of the Journal of Electronic Testing-Springer and Microelectronics Journal-Elsevier. He has a decade of industry experience, including working on FPGA systems in industry.<br/><br/>Mohsen Raji received his Ph.D. degree in computer engineering from Amirkabir University of Technology, Tehran, Iran. He has been serving as an Assistant Professor in School of Electrical and Computer Engineering, Shiraz University, Shiraz, Iran, since 2015. He teaches courses such as VLSI systems design, microprocessors, embedded systems, fault tolerant system design. He has supervised or co-supervised about 10 graduate students and published over 30 refereed papers. He is serving as an associated editor of Iranian Journal of Science and Technology, Transactions of Electrical Engineering. His current research interests include dependable computing, reliable and robust logic designs, design automation of digital systems, and embedded systems.<br/>
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc. note Includes Bibliographical References and Index
520 ## - SUMMARY, ETC.
Summary, etc. Summary:<br/>This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today’s reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
9 (RLIN) 2188
Topical term or geographic name entry element Integrated Circuits Very Large Scale Integration
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
9 (RLIN) 154683
Topical term or geographic name entry element Embedded Computer Systems
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Microelectronics
9 (RLIN) 19062
700 ## - ADDED ENTRY--PERSONAL NAME
Relator term author
Personal name Raji, Mohsen
9 (RLIN) 673806
856 ## - ELECTRONIC LOCATION AND ACCESS
Link text publisher link
Uniform Resource Identifier <a href="https://link.springer.com/book/10.1007/978-3-030-51610-9#toc">https://link.springer.com/book/10.1007/978-3-030-51610-9#toc</a>
856 ## - ELECTRONIC LOCATION AND ACCESS
Link text TOC
Uniform Resource Identifier <a href="https://eaklibrary.neduet.edu.pk:8443/catalog/bk/books/toc/9783030516093.pdf">https://eaklibrary.neduet.edu.pk:8443/catalog/bk/books/toc/9783030516093.pdf</a>
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme Dewey Decimal Classification
Koha item type Book
Holdings
Withdrawn status Lost status Source of classification or shelving scheme Physical Form Damaged status Not for loan Purchased by Department/Discipline Home library Current library Shelving location Date acquired Source of acquisition Stock Type Cost, normal purchase price Total Checkouts Full call number Barcode Date last seen Date last checked out Budget Year Cost, replacement price Accession Date Koha item type
    Dewey Decimal Classification Text, Hardcover     Department of Electronic Engineering Circulation Section Circulation Section Circulation Section 26/01/2023 27 Purchased 17148.14 1 621.3815 GHA 97867 21/02/2024 12/05/2023 2022-23 20174.28 26/01/2023 Lending Collection