MARC details
000 -LEADER |
fixed length control field |
03713nam a22002657a 4500 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
fixed length control field |
230203s2021 |||||||| |||| 00| 0 eng d |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
9783030516093 |
022 ## - INTERNATIONAL STANDARD SERIAL NUMBER |
ISSN-L |
9783030516093 |
041 ## - LANGUAGE CODE |
Language code of text/sound track or separate title |
English |
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
Classification number |
621.3815 |
Item number |
GHA |
100 ## - MAIN ENTRY--PERSONAL NAME |
Personal name |
Ghavami, Behnam |
9 (RLIN) |
673658 |
Relator term |
author |
245 ## - TITLE STATEMENT |
Title |
Soft Error Reliability of VLSI Circuits Analysis and Mitigation Techniques |
260 ## - PUBLICATION, DISTRIBUTION, ETC. |
Place of publication, distribution, etc. |
Cham, Switzerland : |
Name of publisher, distributor, etc. |
Springer, |
Date of publication, distribution, etc. |
c2021 |
300 ## - PHYSICAL DESCRIPTION |
Extent |
XIII, 114 p. |
Other physical details |
: ill |
500 ## - GENERAL NOTE |
General note |
Behnam Ghavami was born in Esfarayen, Iran. He received his Ph.D. degree in computer engineering from Amirkabir University of Technology, Tehran, Iran. He has been serving as a Faculty Member with the Computer Engineering Department, Shahid Bahonar University of Kerman, since 2010, where he is currently Tenured Associate Professor. He teaches courses in design of digital systems, computer architecture, FPGA design, and reliable circuit design. He has supervised or co-supervised about 20 graduate students. He has published over 100 refereed papers. His research interests include the design automation of digital systems, robust logic designs, and FPGA-based design. He is currently an Associate Editor of the Journal of Electronic Testing-Springer and Microelectronics Journal-Elsevier. He has a decade of industry experience, including working on FPGA systems in industry.<br/><br/>Mohsen Raji received his Ph.D. degree in computer engineering from Amirkabir University of Technology, Tehran, Iran. He has been serving as an Assistant Professor in School of Electrical and Computer Engineering, Shiraz University, Shiraz, Iran, since 2015. He teaches courses such as VLSI systems design, microprocessors, embedded systems, fault tolerant system design. He has supervised or co-supervised about 10 graduate students and published over 30 refereed papers. He is serving as an associated editor of Iranian Journal of Science and Technology, Transactions of Electrical Engineering. His current research interests include dependable computing, reliable and robust logic designs, design automation of digital systems, and embedded systems.<br/> |
504 ## - BIBLIOGRAPHY, ETC. NOTE |
Bibliography, etc. note |
Includes Bibliographical References and Index |
520 ## - SUMMARY, ETC. |
Summary, etc. |
Summary:<br/>This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today’s reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
9 (RLIN) |
2188 |
Topical term or geographic name entry element |
Integrated Circuits Very Large Scale Integration |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
9 (RLIN) |
154683 |
Topical term or geographic name entry element |
Embedded Computer Systems |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Microelectronics |
9 (RLIN) |
19062 |
700 ## - ADDED ENTRY--PERSONAL NAME |
Relator term |
author |
Personal name |
Raji, Mohsen |
9 (RLIN) |
673806 |
856 ## - ELECTRONIC LOCATION AND ACCESS |
Link text |
publisher link |
Uniform Resource Identifier |
<a href="https://link.springer.com/book/10.1007/978-3-030-51610-9#toc">https://link.springer.com/book/10.1007/978-3-030-51610-9#toc</a> |
856 ## - ELECTRONIC LOCATION AND ACCESS |
Link text |
TOC |
Uniform Resource Identifier |
<a href="https://eaklibrary.neduet.edu.pk:8443/catalog/bk/books/toc/9783030516093.pdf">https://eaklibrary.neduet.edu.pk:8443/catalog/bk/books/toc/9783030516093.pdf</a> |
942 ## - ADDED ENTRY ELEMENTS (KOHA) |
Source of classification or shelving scheme |
Dewey Decimal Classification |
Koha item type |
Book |