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A Storage-Based Built-In Test Pattern Generation Method for Scan Circuits Based on Partitioning and Reduction of A Precomputed Test Set

Pomeranz, I.

A Storage-Based Built-In Test Pattern Generation Method for Scan Circuits Based on Partitioning and Reduction of A Precomputed Test Set - 1282-1293 p.

Subjects--Topical Terms:
Built-In Self-Test

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