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Modeling of Electron Mobility Degradation By Remote Coulomb Scattering in Ultrathin Oxide Mosfets

Esseni, David Abramo, Antonio

Modeling of Electron Mobility Degradation By Remote Coulomb Scattering in Ultrathin Oxide Mosfets - 1665-1674 p.

Subjects--Topical Terms:
Mobility Degradation
Mobility Modeling

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