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Critical Discussion ofFront-Back Gate Coupling Effect onLow-Frequency Noise in Fully Depleted Soi Mosfets

Simoen, E. Mercha, A

Critical Discussion ofFront-Back Gate Coupling Effect onLow-Frequency Noise in Fully Depleted Soi Mosfets - 1008-1016 p.

Subjects--Topical Terms:
Fully Depleted Mosfet
Low-Frequency

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