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In Vivo Measurement ofBrain and Skull Resistivities Using An Eit-Based Method andCombined Analysis of Sef/Sep Data

Goncalves, S

In Vivo Measurement ofBrain and Skull Resistivities Using An Eit-Based Method andCombined Analysis of Sef/Sep Data - 1124-1128 p.

Subjects--Topical Terms:
Eeg Inverse Problem
Electric Impedance tomography

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