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Thermalelectro-Feedback Model for Multi-Emitter Finger Power Heterojunction Bipolar Transistor Partii: Current Crush Phenomenon

Yarn, K. F. Wang, Y. H.

Thermalelectro-Feedback Model for Multi-Emitter Finger Power Heterojunction Bipolar Transistor Partii: Current Crush Phenomenon - 581-588 p.

Subjects--Topical Terms:
Current Crush
Ndr
Bllast Resistor

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