Normal view MARC view ISBD view

High Mechanical Reliability of Back-Ground Gaas Lsi Chips with Low Thermal Resistance

Nishiguchi, Masanori Goto, Noboru Nishizawa, Hideaki

High Mechanical Reliability of Back-Ground Gaas Lsi Chips with Low Thermal Resistance - 848-854 p.

Subjects--Topical Terms:
Gaas Lsi Chips
Thermal Resistance
Back-Ground

Print
Request article
Suggest for purchase
Send to device
Save record
BIBTEX Dublin Core ISBD MARCXML RIS
More searches

Search for this title in:
Other Databases (Google Scholar) Open Library (openlibrary.org) Pakistan Union Catalogue (pastic.gov.pk) Other Libraries (WorldCat)