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Physicaliy-Based Threshold Voltage Determination for Mosfet'S of Ali Gate Lengths

Tsuno, Morikazu Tanaka, Masayasu Hirose, Masataka

Physicaliy-Based Threshold Voltage Determination for Mosfet'S of Ali Gate Lengths - 1429-1434 p.

Subjects--Topical Terms:
Reliability Loss
Voltage Dip

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