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Stress-Induced Leakage Current of Tunnel Oxide Derived from Flash Memory Read-Disturb Characteristics

Satoh, Shinji Rozansky, David A Aritome, SeIIchi

Stress-Induced Leakage Current of Tunnel Oxide Derived from Flash Memory Read-Disturb Characteristics - 482-486 p.

Subjects--Topical Terms:
Characteristic Speeds

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