Normal view MARC view ISBD view

Field and Temperature Acceleration Model for Time-Dependent Dielectric Breakdown

Kimura, Mikihiro

Field and Temperature Acceleration Model for Time-Dependent Dielectric Breakdown - 220-229 p.

Subjects--Topical Terms:
Mos Capacitors
Oxide Breakdown
Oxide Gas

Print
Request article
Suggest for purchase
Send to device
Save record
BIBTEX Dublin Core ISBD MARCXML RIS
More searches

Search for this title in:
Other Databases (Google Scholar) Open Library (openlibrary.org) Pakistan Union Catalogue (pastic.gov.pk) Other Libraries (WorldCat)