Interface Trap Generation by Fn Injection Under Dynamic Oxide Field Stress
Chen, T.P. Lo, K. F. li, Stelia
Interface Trap Generation by Fn Injection Under Dynamic Oxide Field Stress - 1920-1926 p.
Integrated Circuit Reliability
Mosfets
Interface Trap Generation by Fn Injection Under Dynamic Oxide Field Stress - 1920-1926 p.
Integrated Circuit Reliability
Mosfets