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limitations of Conductance ToMeasurement OfInterface State Density of Mos Capacitoras with Tunneling Gate Gate Dielectrdics

Vogel, Eric M. Henson, W. Kirklen Suehle, John S.

limitations of Conductance ToMeasurement OfInterface State Density of Mos Capacitoras with Tunneling Gate Gate Dielectrdics - 601-608 p.

Subjects--Topical Terms:
Capacitance
Conductance
Dielectric Films

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