Normal view MARC view ISBD view

The Impact Ofintrinsic Device Fluctuations on Cmos Sram Celi Jstability

Bhavnagarwala, A. J Tang, Xinghai Meindl, James D.

The Impact Ofintrinsic Device Fluctuations on Cmos Sram Celi Jstability - 659-665 p.

Subjects--Topical Terms:
Mosfet Fluctuations
Sram Scaling
Static Noise Margin

Print
Request article
Suggest for purchase
Send to device
Save record
BIBTEX Dublin Core ISBD MARCXML RIS
More searches

Search for this title in:
Other Databases (Google Scholar) Open Library (openlibrary.org) Pakistan Union Catalogue (pastic.gov.pk) Other Libraries (WorldCat)